NIKON XT H 225/320 LC COMPUTER TOMOGRAPHY
X-ray Computed Tomography system is a non-destructive technique that enables dynamic imaging (micro-scale) and characterization of materials in their internal and external microstructure. The NIKON XT H 225/320 LC COMPUTER TOMOGRAPH “NYX” enables imaging of materials undergoing various deformation processes (phase reaction, fluid-rock interaction, microfracturing, damage, and weathering) and quantification of their microstructure. It is particularly suitable to image time-scale processes experienced by the materials, both in-situ and ex-situ, so to provide a real assessment of the evolving pore-scale properties. In addition, the NYX XCT can host different deformation rigs, to monitor the response of the materials under different conditions (tension, compression, torsion). The installation of the Deben 10kN rig enables studies of materials under environmental conditions (-10C to +150C).
NYX allows imaging and characterization of materials at their micro-scale. It is a non-destructive technique, and its combination with classical 2-dimensional techniques (often giving higher resolution or providing chemical mapping) proves to be a unique analytical method for the multi-dimensional characterization of materials.
Thanks to the novel non-destructive character, NYX XCT allows a wide range of experiments to study the evolution of geochemical and hydro-mechanical processes within materials at the microscale, from fluid-rock interactions to CCS, weathering, phase reactions and so on.
The location of the XCT scanner within the Advanced Materials Research Laboratory benefits from adjacent analytical instruments, such as an XRD and two SEM. It also benefits from a mechanical workshop, where custom-made sample holders can be prepared and any further request can be accommodated. The ongoing collaboration between our facility and the AMRL thrives to grow interdisciplinary research.